標(biāo)準(zhǔn)號：BS QC 760001-1994
中文標(biāo)準(zhǔn)名稱：電子元器件質(zhì)量評定協(xié)調(diào)體系.膜集成電路和混合集成電路.總規(guī)范.內(nèi)部視力檢驗要求
英文標(biāo)準(zhǔn)名稱：Harmonized system of quality assessment for electronic components - Film and hybrid integrated circuits - Generic specification - Requirements for internal visual inspection
標(biāo)準(zhǔn)類型：L57;L58
發(fā)布日期：1994/10/15 12:00:00
實施日期：1994/10/15 12:00:00
中國標(biāo)準(zhǔn)分類號：L57;L58
國際標(biāo)準(zhǔn)分類號：31.200
適用范圍：The purpose of these examinations is to check the internal naterials,construction and workmanship of film and hybrid integrated circuits(F and HFICs).These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier.