標準號：BS EN 60749-31-2003
中文標準名稱：半導體器件.機械和氣候試驗方法.塑料包封器件的易燃性(內部感應)
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)
標準類型：L40
發布日期：2003/7/4 12:00:00
實施日期：2003/7/4 12:00:00
中國標準分類號：L40
國際標準分類號：13.220.40;31.080.01
適用范圍：This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to internal heating caused by excessive overloads. NOTE This test is identical to the test method contained in 1.1 of chapter 4 of IEC 60749 (1996), apart from changes to this clause, the addition of titles to clauses 2 and 3 and renumbering.