標準號：BS EN 60749-33-2004
中文標準名稱：半導體器件.機械和氣候試驗方法.加速耐濕性.無偏差壓熱器
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
標準類型：L40
發布日期：2004/6/22 12:00:00
實施日期：2004/6/22 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive.