標準號：BS EN 60749-23-2004+A1-2011
中文標準名稱：半導體器件.機械和氣候試驗方法.高溫使用壽命
英文標準名稱：Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
標準類型：L40
發(fā)布日期：2004/6/24 12:00:00
實施日期：2004/6/24 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
引用標準：IEC 60747;IEC 60749-34
適用范圍：This test is used to determine the effects of bias conditions and temperature on solid statedevices over time. It simulates the device operating condition in an accelerated way, and isprimarily used for device qualification and reliability monitoring. A form of high temperaturebias life using a short duration, popularly known as “burn-in”, may be used to screen for infantmortality related failures. The detailed use and application of burn-in is outside the scope ofthis standard.