標準號：BS EN 62132-3-2007
中文標準名稱：集成電路.150 kHz～1 GHz電磁抗擾性的測量.大容量電流注入(BCI)法
英文標準名稱：Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Bulk current injection (BCI) method
標準類型：L56
發布日期：2007/11/30 12:00:00
實施日期：2007/11/30 12:00:00
中國標準分類號：L56
國際標準分類號：31.200
引用標準：IEC 62132-1-2006
適用范圍：This part of IEC 62132 describes a bulk current injection (BCI) test method to measure theimmunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g.resulting from radiated RF disturbances. This method only applies to ICs that have off-boardwire connections e.g. into a cable harness. This test method is used to inject RF current onone or a combination of wires.This standard establishes a common base for the evaluation of semiconductor devices to beapplied in equipment used in environments that are subject to unwanted radio frequencyelectromagnetic signals.