標(biāo)準(zhǔn)號：IEC 62527-2007
中文標(biāo)準(zhǔn)名稱：DC等級規(guī)范用標(biāo)準(zhǔn)測試接口語言(STIL)擴(kuò)展的標(biāo)準(zhǔn)
英文標(biāo)準(zhǔn)名稱：Standard for extensions to Standard Test Interface Language (STIL) for DC level specification
標(biāo)準(zhǔn)類型：L74
發(fā)布日期：2007/11/1 12:00:00
實施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：L74
國際標(biāo)準(zhǔn)分類號：25.040;35.060
引用標(biāo)準(zhǔn)：IEEE Std 1450-1999
適用范圍：This standard defines the following:a) Defines structures in STIL for specifying the DC conditions for a DUT. Examples of the DC conditions for device power supplies are DPS setup, power sequencing to the device, and power supply limiting/clamping. Examples of the DC conditions for commonly used signal references are VIL, VIH, VOL, VOH, IOL, IOH, VREF, VClampLow, and VClampHi.b) Defines structures I STIL such that the DC conditions may be specified either globally, by pattern burst, by pattern, or by vector.c) Defines structures in STIL to allow specification of alternate DC levels, Examples of commonly used alternate levels are VIHH, VIPP, and VILL.d) Defines structures in STIL such that the DC levels and alternate levels can be selected within a period, much the same as timed format events.