標準號：IEC 62526-2007
中文標準名稱：半導(dǎo)體設(shè)計環(huán)境用標準試驗接口語言(STIL)擴展標準
英文標準名稱：Standard for extensions to Standard Test Interface Language (STIL) for semiconductor design environments
標準類型：L74
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L74
國際標準分類號：25.040
適用范圍：Structures are defined in STIL to support usage as semiconductor simulation stimulus, including(1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test(BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel orasynchronous pattern execution on different design blocks, and (5) expression-based conditional executionof pattern constructs.Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design4(i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.Structures are defined in STIL to relate fail information from device testing environments back to originalstimulus and design data elements.