標準號：BS EN 60749-38-2008
中文標準名稱：半導體器件.機械和氣候試驗方法.帶存儲器的半導體器件用軟錯誤試驗法
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
標準類型：L40
發布日期：2008/6/30 12:00:00
實施日期：2008/6/30 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility ofsemiconductor devices with memory when subjected to energetic particles such as alpharadiation. Two tests are described; an accelerated test using an alpha radiation source and an(unaccelerated) real-time system test where any errors are generated under conditions ofnaturally occurring radiation which can be alpha or other radiation such as neutron. Tocompletely characterize the soft error capability of an integrated circuit with memory, thedevice must be tested for broad high energy spectrum and thermal neutrons using additionaltest methods. This test method may be applied to any type of integrated circuit with memorydevice.