標準號：BS EN 60444-9-2007
中文標準名稱：石英晶體元件參數測量.壓電晶體元件寄生振蕩測量
英文標準名稱：Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
標準類型：L21
發布日期：2007/5/31 12:00:00
實施日期：2007/5/31 12:00:00
中國標準分類號：L21
國際標準分類號：31.140
適用范圍：This part of IEC 60444 describes two methods for determining the spurious (unwanted) modesof piezoelectric crystal resonators. It extends the capabilities and improves the reproducibilityand accuracy compared to previous methods.The previous methods described in IEC 60283 (1968) were based on the use of a measuringbridge, which applies to non-traceable components such as variable resistors and a hybridtransformer, which are no longer commercially available.Method A (Full parameter determination)Full parameter determination allows the determination of the equivalent parameters of thespurious resonances and is based on the methods described in IEC 60444-5 using the samemeasurement equipment. It is the preferred method, which can be applied to themeasurement of low and medium impedance spurious resonances up to several kΩ.Method B (Resistance determination)Resistance determination should be used for the determination of high impedance spuriousresonances as specified, for example for certain filter crystals. It uses the same testequipment as method A in conjunction with a test fixture, which consists of commerciallyavailable microwave components such as a 180° hybrid coupler and a 10 dB attenuator, whichare well-defined in a 50 Ω environment. This method is an improvement to the “referencemethod” of the obsolete IEC 60283.