標(biāo)準(zhǔn)號：IEEE 1450.3-2007
中文標(biāo)準(zhǔn)名稱：試驗器目標(biāo)規(guī)范用標(biāo)準(zhǔn)試驗接口語言(STIL)(IEEE Std 1450-1999)的擴(kuò)展標(biāo)準(zhǔn)
英文標(biāo)準(zhǔn)名稱：Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450?1999) for Tester Target Specification Computer Society
標(biāo)準(zhǔn)類型：L74
發(fā)布日期：2007/3/8 12:00:00
實施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：L74
國際標(biāo)準(zhǔn)分類號：35.060
適用范圍：Defines structures in STIL: 1. For the specification of resource mapping of ATE hardware architecture. An example of resource mapping is the assignment of tester resources to waveform characters that are used in STIL-vectors. 2. For including ATE specific instructions in-line with the STIL data. 3. That allow for 'incremental processing' whereby a set of STIL files may be targeted to multiple ATE systems by allowing separately identified ATE data to co-exist. 4. For defining tester rules checks to ensure that the set of generated STIL files conform to the selected resources on one or more ATE systems. 5. For the specification of the resources required for the execution of a set of STIL files on a given ATE system.