標(biāo)準(zhǔn)號：ISO 22489-2006
中文標(biāo)準(zhǔn)名稱：微光束分析.電子探針微量分析.運用波長色散X射線光譜測量法定量分析塊狀樣品
英文標(biāo)準(zhǔn)名稱：Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
標(biāo)準(zhǔn)類型：G04
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：G04
國際標(biāo)準(zhǔn)分類號：71.040.50
適用范圍：This International Standard specifies requirements for the quantification of elements in a micrometre-sizedvolume of a specimen identified through analysis of the X-rays generated by an electron beam using awavelength-dispersive spectrometer (WDS) fitted either to an electron probe microanalyser or to a scanningelectron microscope (SEM).It describes:— the principle of the quantitative analysis;— the general coverage of this technique in terms of elements, mass fractions and reference specimens;— the general requirements for the instrument;— the fundamental procedures involved, such as specimen preparation, selection of experimental conditions,the measurements, the analysis of these and the report.This International Standard is intended for the quantitative analysis of a flat and homogeneous bulk specimenusing a normal incidence beam. It does not specify detailed requirements for either the instruments or the datareduction software. Operators should obtain information such as installation conditions, detailed procedures foroperation and specification of the instrument from the makers of any products used.