標(biāo)準(zhǔn)號(hào)：ASTM E668-2000
中文標(biāo)準(zhǔn)名稱(chēng)：運(yùn)用熱發(fā)光放射量測(cè)定系統(tǒng)(TLD)在電子設(shè)備放射危害性試驗(yàn)中測(cè)定吸收劑量的標(biāo)準(zhǔn)實(shí)施規(guī)范
英文標(biāo)準(zhǔn)名稱(chēng)：Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
發(fā)布日期：1999/12/31 12:00:00
實(shí)施日期：1999/12/31 12:00:00
國(guó)際標(biāo)準(zhǔn)分類(lèi)號(hào)：31.020 (Electronic components in general)
適用范圍： Note 1-The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost.