標(biāo)準(zhǔn)號(hào)：BS EN 61000-4-29-2001
中文標(biāo)準(zhǔn)名稱：電磁兼容性(EMC).試驗(yàn)和測(cè)量技術(shù).直流輸入電力端口的電壓暫降,短時(shí)中斷和電壓變化.抗擾度試驗(yàn).基礎(chǔ)電磁兼容性(EMC)出版物
英文標(biāo)準(zhǔn)名稱：Electromagnetic compatibility (EMC). Testing and measurement techniques. Testing and measurement techniques. Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests. Voltage dips, short interruptions and voltage va
標(biāo)準(zhǔn)類型：L06
發(fā)布日期：2001/7/15 12:00:00
實(shí)施日期：2001/7/15 12:00:00
中國(guó)標(biāo)準(zhǔn)分類號(hào)：L06
國(guó)際標(biāo)準(zhǔn)分類號(hào)：33.100.20
適用范圍：This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low voltage d.c. power ports of equipment supplied by external d.c. networks. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. input power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure. The test described hereinafter applies to electrical and electronic equipment and systems. It also applies to modules or subsystems whenever the EUT (equipment under test) rated power is greater than the test generator capacity specified in clause 6. The ripple at the d.c. input power port is not included in the scope of this part of IEC 61000. It is covered by IEC 61000-4-17