標(biāo)準(zhǔn)號：DIN EN 14784-1-2005
中文標(biāo)準(zhǔn)名稱：無損檢驗.儲磷成像板工業(yè)計算機射線照相.第1部分:系統(tǒng)分類
英文標(biāo)準(zhǔn)名稱：Non-destructive testing - Industrial computed radiography with storage phosphor imaging plates - Part 1: Classification of systems; English version of DIN EN 14784-1
標(biāo)準(zhǔn)類型：H26
發(fā)布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：H26
國際標(biāo)準(zhǔn)分類號：19.100
引用標(biāo)準(zhǔn)：EN 462-5;EN 584-1
適用范圍：This European Standard specifies fundamental parameters of computed radiography systems with the aim ofenabling satisfactory and repeatable results to be obtained economically. The techniques are based both onfundamental theory and test measurements. This document specifies the performance of computedradiography (CR) systems and the measurement of the corresponding parameters for the system scanner andstorage phosphor imaging plate (IP). It describes the classification of these systems in combination withspecified metal screens for industrial radiography. It is intended to ensure that the quality of images - as far asthis is influenced by the scanner-IP system - is in conformity with the requirements of Part 2 of this document.The document relates to the requirements of film radiography defined in EN 584-1 and ISO 11699-1.This European Standard defines system tests at different levels. More complicated tests are described, whichallow the determination of exact system parameters. They can be used to classify the systems of differentsuppliers and make them comparable for users. These tests are specified as manufacturer tests. Some ofthem require special tools, which are usually not available in user laboratories. Therefore, simpler user testsare also described, which are designed for a fast test of the quality of CR systems and long term stability.There are several factors affecting the quality of a CR image including geometrical un-sharpness, signal/noiseratio, scatter and contrast sensitivity. There are several additional factors (e.g. scanning parameters), whichaffect the accurate reading of images on exposed IPs using an optical scanner.The quality factors can be determined most accurately by the manufacturer tests as described in thisdocument. Individual test targets, which are recommended for practical user tests, are described for qualityassurance. These tests can be carried out either separately or by the use of the CR Phantom (Annex B). ThisCR Phantom incorporates many of the basic quality assessment methods and those associated with thecorrect functioning of a CR system, including the scanner, for reading exposed plates and in correctly erasingIPs for future use of each plate.The CR System classes in this document do not refer to any particular manufacturers Imaging Plates. A CRsystem class results from the use of a particular imaging plate together with the exposure conditions -particularly total exposure - the scanner type and the scanning parameters.