標(biāo)準(zhǔn)號：BS EN 14784-2-2005
中文標(biāo)準(zhǔn)名稱：無損檢驗(yàn).用存儲熒光成像板的工業(yè)計算輻射攝影術(shù).用X射線和γ射線檢驗(yàn)金屬材料的一般原則
英文標(biāo)準(zhǔn)名稱：Non-destructive testing - Industrial computed radiography with storage phosphor imaging plates - General principles for testing of metallic materials using X-rays and gamma rays
標(biāo)準(zhǔn)類型：H26
發(fā)布日期：2005/9/27 12:00:00
實(shí)施日期：2005/9/27 12:00:00
中國標(biāo)準(zhǔn)分類號：H26
國際標(biāo)準(zhǔn)分類號：19.100
適用范圍：This European Standard specifies fundamental techniques of computed radiography with the aim of enabling satisfactory and repeatable results to be obtained economically. The techniques are based on the fundamental theory of the subject and tests measurements. This document specifies the general rules for industrial computed X-and gamma radiography for flaw detection purposes, using storage phosphor imaging plates (IP). It is based on the general principles for radiographic examination of metallic materials on the basis of films (EN 444 and ISO 5579). The basic set-up of radiation source, detector and the corresponding geometry shall be applied in agreement with EN 444 and ISO 5579 and the corresponding product standards as e.g. EN 1435 for welding and EN 12681 for foundry. It does not lay down acceptance criteria of the imperfections.