標(biāo)準(zhǔn)號(hào)：BS EN 61290-10-4-2007
中文標(biāo)準(zhǔn)名稱：光學(xué)放大器.試驗(yàn)方法.多道參數(shù).使用光譜分析儀的內(nèi)插源減少法
英文標(biāo)準(zhǔn)名稱：Optical amplifiers - Test methods - Multichannel parameters - Interpolated source subtraction method using an optical spectrum analyzer
標(biāo)準(zhǔn)類型：M33
發(fā)布日期：2007/9/28 12:00:00
實(shí)施日期：2007/9/28 12:00:00
中國(guó)標(biāo)準(zhǔn)分類號(hào)：M33
國(guó)際標(biāo)準(zhǔn)分類號(hào)：33.180.30
引用標(biāo)準(zhǔn)：IEC 61291-1-2006;IEC 61291-4
適用范圍：This part of IEC 61290 applies to all commercially available optical amplifiers (OAs) andoptically amplified subsystems. It applies to OAs using optically pumped fibres (OFAs basedon either rare-earth doped fibres or on the Raman effect), semiconductor optical amplifiers(SOAs) and waveguides (POWA).This method is called interpolated source subtraction (ISS) because the amplifiedspontaneous emission (ASE) at each channel is obtained by interpolating from measurementsat a small wavelength offset around each channel. To minimize the effect of sourcespontaneous emission, the effect of source noise is subtracted from the measured noise.The accuracy of the ISS technique degrades at high input power level due to the spontaneousemission from the laser source(s). Annex A provides guidance on the limits of this techniquefor high input power.An additional source of inaccuracy is due to interpolation error. Annex A provides guidance onthe magnitude of interpolation error for a typical amplifier ASE versus wavelengthcharacteristic.