標準號：BS EN 60749-17-2003
中文標準名稱：半導體器件.機械和氣候試驗方法.中子輻照
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Neutron irradiation
標準類型：L40
發布日期：2003/6/19 12:00:00
實施日期：2003/6/19 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for military-and space-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 4).