標準號：BS EN 60749-14-2003
中文標準名稱：半導體器件.機械和氣候試驗方法.端子的耐久性
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Robustness of terminations (lead integrity)
標準類型：L40
發布日期：2003/12/15 12:00:00
實施日期：2003/12/15 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly. For hermetic packages, it is recommended that this test be followed by hermeticity tests in accordance with IEC 60749-8 to determine if there are any adverse effects from the stresses applied to the seals as well as to the leads. This test, including each of the test conditions, is considered destructive and is only recommended for qualification testing. This standard is applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.