標準號：BS EN 60749-12-2002
中文標準名稱：半導體裝置.機械和氣候試驗方法.變頻率振動
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
標準類型：L40
發(fā)布日期：2002/9/10 12:00:00
實施日期：2002/9/10 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. In general, this variable frequency vibration test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply.