標(biāo)準(zhǔn)號(hào)：SIS SS-ISO 9067-1989
中文標(biāo)準(zhǔn)名稱：信息處理系統(tǒng)．?dāng)?shù)據(jù)傳遞．運(yùn)用測(cè)試循環(huán)指令自動(dòng)進(jìn)行錯(cuò)誤隔離的程序
英文標(biāo)準(zhǔn)名稱：Information processing systems — Data communication — Automatic fault isola- tion procedures using test loops
發(fā)布日期：1989/2/15 12:00:00
實(shí)施日期：1999/12/31 12:00:00
適用范圍：This International Standard describes fault isolation procedures using test loops and applies to DTEs which are connected to DCEs with the automatic test loop facility, standardized in the V-series or X-series CCITT1) Recommendations.In the V-series, the means for DTE control of test loops via interchange circuits in the DTE/DCE interface are specified in CCITT Recommendations V.24 and V.54.In the X-series, the means for DTE control of test loops via interchange circuits or signals in the DTE/DCE interface are specified in CCITT Recommendations X.24, X.150 and the individual DTE/DCE Interface CCITT Recommendations X.20, X.20 bis, X.21, X.21 bis and X.22.NOTES1 CCITT Recommendation X.150 specifies the definition of test loops, the principles for the control of test loops and the principles for the indications to be presented. Specific details concerning the implementation of these principles are contained in the individual DTE/DCE Interface Recommendations.2 The inclusion of test procedures covered by the I-series Recommendations is for further study.