標準號：SIS SS IEC 333-1986
中文標準名稱：核檢測儀表．半導體帶電微粒探測器測試程序
英文標準名稱：Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors
發布日期：1986/6/25 12:00:00
實施日期：1999/12/31 12:00:00
適用范圍：This standard applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged particle detectors. Some superior techniques are not included because the methods are too complex or require equipment (such as particle accelerators) which may not be readily available.Test procedures for the associated amplifiers and preamplifiers are described in IEC Publication 340: Test Procedures for Amplifiers and Preamplifiers for Semiconductor Detectors for Ionizing Radiation.