標準號：BS DD IEC/TS 62215-2-2007
中文標準名稱：集成電路.脈沖抗擾度的測量.同步瞬時注射法
英文標準名稱：Integrated circuits - Measurement of impulse immunity - Synchronous transient injection method
標準類型：L56
發布日期：2007/11/30 12:00:00
實施日期：2007/11/30 12:00:00
中國標準分類號：L56
國際標準分類號：31.200
適用范圍：IEC/Ts 62215-2，which is a technical specification，contains general information and definitions on the test method to evaluate the immunity of integrated circuits(ICs)against fast conducted synchronous transient disturbances．This information is followed by a description of measurement conditions，test equipment and test set—up as well as the test procedures and the requirements on the content of the test report． the objective of this technical specification is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment．Critical parameters that are expected to influence the test results are described．Deviations from this specification should be explicitly noted in the individual test report． this synchronous transient immunity measurement method，as described in this specification． uses short impulses with fast rise times of different amplitude，duration and polarity in a conductive mode to the IC．In this method，the applied impulse should be synch ronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured．