標準號：BS EN 60749-9-2002
中文標準名稱：半導體器件.機械和氣候試驗方法.永久性標記
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Permanence of marking
標準類型：L40
發布日期：2002/9/24 12:00:00
實施日期：2002/9/24 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：The purpose of this part of IEC 60749 is to test and verify that the markings onsemiconductor devices will not become illegible when subject to solvents or cleaning solutionscommonly used during the removal of solder flux residue from the printed circuit boardassembly process.This test is applicable for all package types. It is suitable for use in qualification and/orprocess monitor testing. The test should be considered non-destructive. Electrical ormechanical rejects may be used for the purpose of this test.In general, this test of permanence of marking is in conformity with IEC 60068-2-45 but, dueto specific requirements of semiconductors, the clauses of this standard apply.