標(biāo)準(zhǔn)號：ISO 13084-2011
中文標(biāo)準(zhǔn)名稱：表面化學(xué)分析.二次離子質(zhì)譜分析法.飛行時(shí)間二次離子質(zhì)譜儀用質(zhì)量標(biāo)度的校準(zhǔn)
英文標(biāo)準(zhǔn)名稱：Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
標(biāo)準(zhǔn)類型：G04
發(fā)布日期：2011/5/15 12:00:00
實(shí)施日期：1999/12/31 12:00:00
中國標(biāo)準(zhǔn)分類號：G04
國際標(biāo)準(zhǔn)分類號：71.040.40
適用范圍：This International Standard specifies a method to optimize the mass calibration accuracy in time-of-flight SIMSinstruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is notrestricted to any particular instrument design. Guidance is provided for some of the instrumental parametersthat can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scalefor optimum mass accuracy.