標(biāo)準(zhǔn)號：BS EN 60749-33-2004
中文標(biāo)準(zhǔn)名稱：半導(dǎo)體器件.機(jī)械和氣候試驗(yàn)方法.加速耐濕性.無偏差壓熱器
英文標(biāo)準(zhǔn)名稱：Semiconductor devices - Mechanical and climatic test methods - Accelerated moisture resistance - Unbiased autoclave
標(biāo)準(zhǔn)類型：L40
發(fā)布日期：2004/6/22 12:00:00
實(shí)施日期：2004/6/22 12:00:00
中國標(biāo)準(zhǔn)分類號：L40
國際標(biāo)準(zhǔn)分類號：31.080.01
適用范圍：The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive.