標(biāo)準(zhǔn)號：BS ISO 22489-2007
中文標(biāo)準(zhǔn)名稱：微光束分析.電子探針微量分析.用波長色散X-射線光譜測量法作塊狀樣品的定量點分析
英文標(biāo)準(zhǔn)名稱：Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
標(biāo)準(zhǔn)類型：A43;G04
發(fā)布日期：2007/2/28 12:00:00
實施日期：2007/2/28 12:00:00
中國標(biāo)準(zhǔn)分類號：A43;G04
適用范圍：ISO 22489:2006 specifies requirements for the quantification of elements in a micrometre-sized volume of a specimen identified through analysis of the X-rays generated by an electron beam using wavelength-dispersive spectrometers fitted either to an electron probe microanalyser or to a scanning electron microscope.It describes the principle of the quantitative analysis, the general coverage of this technique in terms of elements, mass fractions and reference specimens, the general requirements for the instrument, and the fundamental procedures involved, such as specimen preparation, selection of experimental conditions, the measurements, the analysis of these and the report.It is intended for the quantitative analysis of a flat and homogeneous bulk specimen using a normal incidence beam. It does not specify detailed requirements for either the instruments or the data reduction software. Operators should obtain information such as installation conditions, detailed procedures for operation and specification of the instrument from the makers of any products used.