標準號：IEC 60749-36-2003
中文標準名稱：半導體器件.機械和氣候試驗方法.第36部分:穩態加速
英文標準名稱：Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
標準類型：L40
發布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L40
國際標準分類號：31.080.01
適用范圍：This part of IEC 60749 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test. It may be used as a high stress (destructive) test to determine the mechanical limits of the package, internal metallisation and lead system, die or substrate attachment, and other elements of the microelectronic device. When proper stress levels have been established this test method may also be employed as a non-destructive in-line 100 % screen to detect and eliminate devices with lower than normal mechanical strengths in any of the structural elements. In general, this acceleration steady-state test method is in conformity with IEC 60068-2-7 but, due to specific requirements of semiconductors, the clauses of this standard apply.