標準號：BS DD ISO/TS 13762-2002
中文標準名稱：粒徑分析.小角度X射線散射法
英文標準名稱：Particle size analysis - Small angle X-ray scattering method
標準類型：N50
發(fā)布日期：2002/12/4 12:00:00
實施日期：2002/12/4 12:00:00
中國標準分類號：N50
國際標準分類號：19.120
適用范圍：This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.