標準號：IEC/PAS 62162 Edition 1.0-2000
中文標準名稱：微電子元件抗靜電放電域值的場誘導放電裝置模型的試驗方法
英文標準名稱：Filed-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
標準類型：L50
發布日期：1999/12/31 12:00:00
實施日期：1999/12/31 12:00:00
中國標準分類號：L50
國際標準分類號：31.080.01
適用范圍：All packaged semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. The test methods described in this standard may also be used to evaluate components that are shipped as wafers or bare chips. To perform the tests, the components must be assembled into a package similar to that expected in the final application. The package used shall be recorded.